- Titel
- Automated and Optimized Lot-To-Order Matching in 300 mm Semiconductor Facilities
- Zitierfähige Url:
- https://nbn-resolving.org/urn:nbn:de:bsz:14-qucosa2-970746
- Konferenz
- 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference. Online-Konferenz, 10.05.-12.05.2021
- Quellenangabe
- 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
; Proceedings
Herausgeber: Annual SEMI Advanced Semiconductor Manufacturing Conference
Erscheinungsort: Piscataway, NJ
Verlag: IEEE
Erscheinungsjahr: 2021
Artikelnummer: 9435730 - Erstveröffentlichung
- 2021
- Abstract (EN)
- Lot-to-order matching (LTOM) is considered a critical step in the manufacturing process as an inefficient allocation has substantial adverse impacts on fab performance. Several optimization approaches have been developed in research, but successful use cases and best practices are scarce, particularly for 300 mm semiconductor facilities. Our contribution addresses this insufficiency and presents the approach and results of an automation and optimization project for the LTOM process of 300 mm production lines at Infineon Technologies Dresden and Austria. Within our approach, we first analyzed and standardized the former manual as-is process using the Business Process Model and Notation approach to enable it for automation before we focused on further targeted optimization of the process and the developed IT artifact. The results led to considerable positive effects on essential qualitative and quantitative KPIs, such as delivery reliability, throughput, customer satisfaction, and workload reduction. Furthermore, we describe challenges that occurred during the project and present applied measures.
- Andere Ausgabe
- Link zum Artikel, der zuerst im Konferenzband „32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)” im Verlag IEEE erschienen ist.
DOI: 10.1109/ASMC51741.2021.9435730 - Freie Schlagwörter (DE)
- Semiconductor device measurement, Automation, Manufacturing processes, Production, Manual, Throughput, Manufacturing
- Freie Schlagwörter (EN)
- lot-to-order matching, case study, factory automation, semiconductor manufacturing
- Klassifikation (DDC)
- 621
- Verlag
- IEEE, Piscataway, NJ
- Förder- / Projektangaben
- European Commission (EC)
H2020 | ECSEL-IA
Integrated Development 4.0
(iDev40)
ID: 783163 - Version / Begutachtungsstatus
- angenommene Version / Postprint / Autorenversion
- URN Qucosa
- urn:nbn:de:bsz:14-qucosa2-970746
- Veröffentlichungsdatum Qucosa
- 23.06.2025
- Dokumenttyp
- Konferenzbeitrag
- Sprache des Dokumentes
- Englisch
- Lizenz / Rechtehinweis
